General Purpose AFM Probes, HQ:CSC17/Al BS, 13 kHz (0.18 N/m), MikroMasch (CAT#: STEM-M-0097-LKN)

Cat Number: STEM-M-0097-LKN

Application: Cantilevers of the 17 series with low spring constant are used mostly in contact mode AFM. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of soft samples.

Model: HQ:CSC17/Al BS

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Description Specification Features Related Products

Description

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Specification

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Aluminum

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