General Purpose AFM Probes, HQ:XSC11/Al BS, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0137-LKN)

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Aluminum

General Purpose AFM Probes, HQ:XSC11/No Al, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0138-LKN)
Long Scanning AFM Probes, HQ:XSC11/Hard/Al BS, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0139-LKN)