Tipless AFM Probes, HQ:CSC38/tipless/Al BS, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0135-LKN)

Cat Number: STEM-M-0135-LKN

Application: Accessories for AFM (Atomic Force Microscopes).

Model: HQ:CSC38/tipless/Al BS

Description Specification Features Related Products

Description

MikroMasch Tipless AFM Probes are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements.

Specification

Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Aluminum

Related Products

Tipless AFM Probes, HQ:CSC38/tipless/Cr-Au, 10 - 20 kHz (0.03 - 0.09 N/m), MikroMasch (CAT#: STEM-M-0136-LKN)
General Purpose AFM Probes, HQ:XSC11/Al BS, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0137-LKN)

Other recommended products

Highly Ordered Pyrolytic Graphite ZYH (HOPG, 3.5° Mosaic Spread), 10 x 10 x 2 mm, 1 chip, MikroMasch (CAT#: STEM-M-0161-LKN)
General Purpose AFM Probes, HQ:CSC37/Al BS, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0124-LKN)
Conductive AFM Probes, HQ:NSC16/Cr-Au, 190 kHz (45 N/m), MikroMasch (CAT#: STEM-M-0077-LKN)
Test Structures TGF11/NM (Grating with Trapezoidal Structures), MikroMasch (CAT#: STEM-M-0155-LKN)
Long Scanning AFM Probes, HQ:NSC36/Hard/Al BS, 65 - 130 kHz (0.6 - 2 N/m), MikroMasch (CAT#: STEM-M-0117-LKN)
Highly Ordered Pyrolytic Graphite ZYA (HOPG, 0.4° Mosaic Spread), 10 x 10 x 1 mm, 1 chip, MikroMasch (CAT#: STEM-M-0156-LKN)
Long Scanning AFM Probes, HQ:NSC18/Hard/ Al BS, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0093-LKN)
Long Scanning AFM Probes, HQ:NSC15/Hard/Al BS, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0071-LKN)