General Purpose AFM Probes, HQ:NSC16/Al BS, 190 kHz (45 N/m), MikroMasch (CAT#: STEM-M-0074-LKN)

Cat Number: STEM-M-0074-LKN

Application: The 16 series cantilevers with high spring constant and low resonance frequency (below 250 kHz) can be used in tapping mode in SPM systems that have a low-frequency feedback loop. These cantilevers also fit SPMs that do not support probes with short lever arms.

Model: HQ:NSC16/Al BS

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Description Specification Features Related Products

Description

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Specification

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Aluminum

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