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Long Scanning AFM Probes, HQ:CSC17/Hard/Al BS, 13 kHz (0.18 N/m), MikroMasch (CAT#: STEM-M-0100-LKN)

Cat Number: STEM-M-0100-LKN

Application: Cantilevers of the 17 series with low spring constant are used mostly in contact mode AFM. It is possible to adjust the scanning parameters to minimize the tip-sample force. Imaging in tapping mode gives the true topography of soft samples.

Model: HQ:CSC17/Hard/Al BS

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Description Specification Related Products

Description

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 20 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Hard Diamond-Like-Carbon
Detector coating: Aluminum

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