High Resolution AFM Probes, Hi'Res-C18/CR-AU, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0089-LKN)

Cat Number: STEM-M-0089-LKN

Application: Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.

Model: Hi'Res-C18/CR-AU

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Description Specification Features Related Products

Description

MikroMasch Hi'RES probes make higher resolution, sub-nanometer imaging possible. The Hi'Res probes allow for more accurate measurement of extremely narrow features such as pores, trenches, and sharp edges, along with accurate measurement of sub-nanometer surface roughness. In addition, these probes are also good for imaging soft, fragile and near-liquid samples as the tip-sample attraction force is significantly reduced due to the unsurpassed subnanometer tip radius. High-resolution probes are recommended for scanning small areas below 250 nm at 512 sampling points. Lateral resolution below 1 nm is attainable.

Specification

Typical spike radius: 1 nm
Spike height: 100 - 200 nm
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold

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