Long Scanning AFM Probes, HQ:NSC18/Hard/ Al BS, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0093-LKN)

Cat Number: STEM-M-0093-LKN

Application: Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.

Model: HQ:NSC18/Hard/ Al BS

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Description Specification Features Related Products

Description

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 20 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 nm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Detector coating: Gold

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