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General Purpose AFM Probes, HQ:NSC15/No Al, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0069-LKN)
Cat Number: STEM-M-0069-LKN
Application: Cantilevers of the 15 series are generally used in tapping mode for imaging hard samples, when high topographic and phase contrast are necessary. The 15 series is also good for non-contact AFM.
Model: HQ:NSC15/No Al
Description
MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.
Specification
Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm
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