Conductive AFM Probes, HQ:NSC18/Pt, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0095-LKN)

Cat Number: STEM-M-0095-LKN

Application: Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.

Model: HQ:NSC18/Pt

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Description Specification Features Related Products

Description

MikroMasch Conductive AFM Probes are ideal for imaging of electric properties of materials in ambient conditions. Though silicon is conducting in bulk due to the presence of the dopants, the surface of the probe is always coated by a thin (1 - 2 nm) native oxide film. That is why using the conductivity of Si probes for AFM measurements is only possible in UHV conditions after the film is removed.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 30 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Platinum
Detector coating: Platinum

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