NEX QC+ EDXRF Spectrometer provides extensive element coverage through the easy-to-learn Windows-based QuantEZ software. Non-destructive analysis from sodium (Na) to uranium (U) in almost all matrices, from solids and alloys to powders, liquids and slurries.
Specification
Element Range:11Na to 92U Sample Type:Solids, Liquids, Powders, Alloys and Thin Films X-Ray Tube:50 kV X-ray Tube (max. 4 W) Detector(s):High performance semiconductor, Peltier thermo-electric cooling Sample Chamber:Air or Helium
Features
50kV X-ray tube with wide element coverage SDD detector has excellent resolution and sensitivity Modern smartphone-style "icon-driven" user interface Multiple automatic tube filters increase sensitivity Convenient built-in thermal printer Low cost, unbeatable price/performance ratio Optional basic parameters
Related Products
NEX CG Cartesian-geometry Energy Dispersive X-ray Fluorescence Spectrometer, NEX DE FAST SDD® EDXRF Spectrometer, NEX DE Variable spot size EDXRF Spectrometer, NEX QC+ QuantEZ Benchtop EDXRF Spectrometer