Scanning electron microscopy to analyze morphology (CAT#: STEM-PET-0016-WXH)

Introduction

Scanning electron microscopy is mainly used to observe and analyze the morphology, structure and composition of sample micro-regions. It is widely used in materials science, physics, chemistry, biology, archaeology, geology and microelectronics industry due to its high resolution, good depth of field and simple operation.
Scanning electron microscope (SEM) is a method of raster scanning on the surface of the sample after the electron beam is focused by the electron gun. It observes and analyzes the composition, shape and structure of the sample surface by detecting the signal generated by the electron acting on the sample.