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Size Measurement of Very Small Spherical Particles by Mie Scattering Imaging (MSI) (CAT#: STEM-ST-0079-YJL)

Introduction

When a plane light wave interacts with a small spherical particle light waves are scattered in all radial directions. The properties of the scattered waves in space and time can be predicted analytically, as originally demonstrated at length by Mie in 1908. In real ensembles such as sprays and clouds, droplet size and velocity distributions are ubiquitous. In order to get information on individual droplets in an ensemble, a short exposure image of the ensemble has to be taken using a laser and a digital camera and the frozen information has to be postprocessed and evaluated.




Principle

Mie scattering is defined as the type of scattering in which the diameter of the particle is the same or more than the wavelength of the radiation. Mie scattering gives a generalized solution for a system where a scattering of light takes place by a homogenous spherical medium. And this medium should have a refractive index different from that of the medium through which the light is traversing.
Unlike Rayleigh scattering, Mie scattering is not a physically independent phenomenon rather, it is a solution to Maxwell's equations for situations where the phase of the incident angle can change within the dimension of the scattering particles. Mie scattering is more commonly known as Mie solution, and it is named after Gustav Mie, a German physicist.
Mie scattering is also known as aerosol particle scattering, takes place in the atmosphere below 1,500 feet. In Mie scattering, the diameter of the spherical particles through which the light is scattered is approximately equal to the wavelength.

Applications

Mie scattering occurs in a variety of applications, including atmospheric science, cancer detection and treatment, metamaterials, and parasitology. Another application is the characterization of particles by optical scattering measurements.

Procedure

1. Sample preparation
2. Measurement by scattering detection instrument
3. Data analysis

Materials

Mie scattering measurement system
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