General Purpose AFM Probes, HQ:NSC18/No Al, 75 kHz (2.8 N/m), MikroMasch (CAT#: STEM-M-0091-LKN)

Cat Number: STEM-M-0091-LKN

Application: Cantilevers of the 18 series are optimal for Lift mode operation AFM as they provide high stability in tapping mode as well as high sensitivity to magnetic and electric forces that may be weak. These cantilevers are also used for mapping of materials properties in force modulation mode and true topography imaging of the soft samples.

Model: HQ:NSC18/No Al

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Description Specification Features Related Products

Description

MikroMasch General Purpose AFM Probes are suitable for most of the routine topography imaging experiments. Using these probes, lateral resolution down to 5 nm is attainable for scan size below 1 μm. Usually, sharpened silicon etched probes are used for general purpose measurements.

Specification

Typical radius of uncoated tip: 8 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm

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