Long Scanning AFM Probes, HQ:NSC14/Hard/Al BS, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0082-LKN)

Cat Number: STEM-M-0082-LKN

Application: Cantilevers of the 14 series are generally used in tapping mode for imaging relatively soft samples to obtain better phase contrast and reduce surface deformations caused by tip tapping. Probes with coatings can also be used in conductive AFM techniques.

Model: HQ:NSC14/Hard/Al BS

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Description Specification Features Related Products

Description

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Specification

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 20 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Hard Diamond-Like-Carbon
Detector coating: Aluminum

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