Long Scanning AFM Probes, HQ:XSC11/Hard/Al BS, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0139-LKN)

MikroMasch Long Scanning AFM Probes are designed for routine AFM measurements of robust samples, especially when the scan size is larger than 2 µm. The probes have a special wear-resistant coating that increases their lifetime.

Typical radius of uncoated tip: 8 nm
Resulting tip radius with the coating: < 20 nm
Full tip cone angle: 40°
Total tip height: 12 - 18 µm
Probe material: n-type silicon
Tip coating: Hard Diamond-Like-Carbon
Detector coating: Aluminum

Conductive AFM Probes, HQ:XSC11/Pt, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0140-LKN)
Conductive AFM Probes, HQ:DPE-XSC11, 15 - 350 kHz (0.2 - 42 N/m), MikroMasch (CAT#: STEM-M-0141-LKN)