Tipless AFM Probes, HQ:CSC37/tipless/No Al, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0128-LKN)

Cat Number: STEM-M-0128-LKN

Application: Accessories for AFM (Atomic Force Microscopes).

Model: HQ:CSC37/tipless/No Al

Description Specification Features Related Products

Description

MikroMasch Tipless AFM Probes are often used for custom applications such as for example attaching spheres or other objects for force spectroscopy measurements.

Specification

Probe material: n-type silicon
Probe bulk resistivity: 0.01 - 0.025 Ohm*cm

Related Products

Tipless AFM Probes, HQ:CSC37/tipless/Al BS, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0129-LKN)
Tipless AFM Probes, HQ:CSC37/tipless/Cr-Au, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0130-LKN)

Other recommended products

Conductive AFM Probes, HQ:NSC14/Cr-Au, 160 kHz (5 N/m), MikroMasch (CAT#: STEM-M-0083-LKN)
Highly Ordered Pyrolytic Graphite ZYH (HOPG, 3.5° Mosaic Spread), 10 x 10 x 2 mm, 1 chip, MikroMasch (CAT#: STEM-M-0161-LKN)
Tipless AFM Probes, HQ:NSC35/tipless/No Al, 150 - 300 kHz (5.4 - 16 N/m), MikroMasch (CAT#: STEM-M-0111-LKN)
Conductive AFM Probes, HQ:CSC37/Pt, 20 - 40 kHz (0.3 - 0.8 N/m), MikroMasch (CAT#: STEM-M-0127-LKN)
Tipless AFM Probes, HQ:NSC35/tipless/Cr-Au, 150 - 300 kHz (5.4 - 16 N/m), MikroMasch (CAT#: STEM-M-0113-LKN)
Test Structures PA01 (AFM Tip Characterization Sample), MikroMasch (CAT#: STEM-M-0144-LKN)
Highly Ordered Pyrolytic Graphite ZYB (HOPG, 0.8° Mosaic Spread), 10 x 10 x 1 mm, 1 chip, MikroMasch (CAT#: STEM-M-0158-LKN)
General Purpose AFM Probes, HQ:NSC15/Al BS, 325 kHz (40 N/m), MikroMasch (CAT#: STEM-M-0068-LKN)